新闻

3D Vision Inspection is rapidly becoming an essential part of smart manufacturing, providing highly accurate and efficient quality control in various industries. Traditional 2D vision inspection is often limited by surface-level data, environmental conditions such as lighting, and the lack of depth information. These limitations can result in errors, especially when detecting surface defects, performing precise measurements, or aligning components. TOF (Time of Flight) technology, a cutting-edge 3D perception tool,...

How Electron Microscopy and Time-of-Flight (ToF) Technology Enhance Scientific Research Electron Microscopy (EM) and Time-of-Flight (ToF) technology are revolutionizing fields like nanotechnology, materials science, and biomedical research. Electron microscopy provides high-resolution imaging at the microscopic and even atomic levels, capturing intricate surface and internal details. However, traditional EM methods capture primarily 2D images, lacking depth information, which limits the ability to fully understand complex structures. ToF technology, which measures light...